aehr test systems, aehr test, aehr, ats, diepak, max, mtx, wafers, wafer burn-in, wafer level burn-in, wafer-level burn-in, aehr test systems,burn-in, parallel test, massively parallel test, tdbi, wlbi, test during burn-in, burn-in board, bib, bibs, parallel test board, gd, known-good die, mbt, mtt, waferpak, fox, max4, max3, max2, atx, atx2, environmental test, environmental stress, halt, hast, memory test, dram test, microprocessor test, logic test, dsp test, digital signal processor test, laser diode burn-in, vcsel burn-in, accelerated life test, bathtub curve, arrhenius, arrhenius equation, mbi, monitored burn-in, soft errors, alpha particle, wafer probe, full wafer probe, full wafer contact, burn-in socket, kgd socket, burn-in carrier, bare die carrier, bare die burn-in

aehr test systems is a leading producer of test and burn-in equipment. the company develops, manufactures and sells systems that are designed to reduce the cost of testing dynamic random access memories (drams) and other integrated circuits (ics), perform reliability screening (burn-in) of complex logic and memory ics, and enable ic manufacturers to perform test and burn-in of bare die. with more than 2,000 systems installed worldwide, aehr test has set the standards for the test and burn-in since 1977.