test testing stimulus systems equipment ate gpib ieee-488 lab view labview compact pci compactpci ccd charge coupled device fpa focal plane focalplane array read out readout ic roic long wave short lwir swir nir ir infra red infrared infra-red irfpa cmos image sensor imager imaging back illuminated back-illuminated high resistivity high-resistivity mercury cadmium telluride mercad hgcdte indium antimonide insb platinum silicide ptsi micro bolometer microbolometer quantum well qwip hole accumulation diode characterization production fpd flat panel display x ray x-ray verify dac fpga asic dynamic burn in burn-in turn key turnkey turn-key integrated complete system systems missile guidance night vision astronomy astronomical space satellite imagery thermal mapping surveillance machine vision industrial automation cameras medical scope spectroscopy spectrometry spectrometer diffraction gradient data acquisition

pulse instruments - systems and equipment for testing ccds, fpas, and cmos image sensors